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Measurement of changes in optical performance due to temperature rise of the LED lamp.
Various characteristics of LED lamps, including temperature dependence, can be measured with a single device.
Measure the minute resistance changes of the wire during the cable bending test and monitor it on a computer!
This device is a measuring instrument designed to accurately measure the resistance value of connected wires. It applies low voltage and high current in a pulsed manner to the wire being measured, allowing for high-precision measurement of the resistance value of the wire. Additionally, by connecting to a PC via a USB cable, it enables real-time display of continuous measurement values and the ability to graph these values. 【Features】 ■ Applies low voltage and high current in a pulsed manner to the wire being measured ■ Measures the resistance value of the wire with high precision ■ Since current is not continuously flowing, there is no damage to the wire being measured ■ Can be used as a standalone resistance measuring device for the wire being measured, as well as a tester for measuring changes over time with GO/NG judgment *For more details, please refer to the PDF document or feel free to contact us.
This is a measuring device that automatically switches between lifetime evaluation and IVL measurement of organic EL devices.
The LIFE & IVL aging change measurement device "Model ELS-100LV" is a device for measuring and evaluating the lifespan and IVL characteristics over time of numerous organic EL devices. It automatically switches between lifespan evaluation measurements and IVL measurements for testing. 【Features】 ○ Capable of capturing images of the light-emitting element's illumination state ○ Lifespan measurement drive power supply: constant current drive For more details, please contact us or download the catalog.
